FEI FIB SEM Focused Ion Beam Scanning Electron Microscope
Beschrijving
P/N FP 2067/3
Spare parts included - see pictures
Bezoekdag(en)
Op afspraak
Visiting days: on appointment between December 2th and January 8th. belgan.pickup@online-auctions.be
Visiting days: on appointment between December 2th and January 8th. belgan.pickup@online-auctions.be
Westerring 15
9700 Oudenaarde
België
Ophaaldag(en)
24/01/2025 - 09:00 tot 15:30
29/01/2025 - 09:00 tot 17:00
29/01/2025 - 09:00 tot 17:00
Westerring 15
9700 Oudenaarde
België